DE
Person
David E. Aspnes
David Erik Aspnes (born 1 May 1939 in Madison, Wisconsin) is an American physicist and a member of the National Academy of Sciences (1998). Aspnes developed fundamental theories of the linear and nonlinear optical properties of materials and thin films, and the technology of spectroscopic ellipsometry (SE). SE is a metrology that is indispensable in the manufacture of integrated circuits.
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